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KMID : 0381920150450040203
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Korean Journal of Microscopy
2015 Volume.45 No. 4 p.203 ~ p.207
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Transmission Electron Microscope Sampling Method for Three-Dimensional Structure Analysis of Two-Dimensional Soft Materials
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Lee Sang-Gil
Lee Ji-Hyun
Yoo Seung-Jo
Suvo Jit Datta
Hwang In-Chul
Yoon Kyung-Byung
Kim Jin-Gyu
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Abstract
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Sample preparation is very important for crystal structure analysis of novel nanostructured materials in electron microscopy. Generally, a grid dispersion method has been used as transmission electron microscope (TEM) sampling method of nano-powder samples. However, it is diffi cult to obtain the cross-sectional information for the tabularstructured materials. In order to solve this problem, we have attempted a new sample preparation method using focused ion beam. Base on this approach, it was possible to successfully obtain the electron diffraction patterns and high-resolution TEM images of the cross-section of tabular structure. Finally, we were able to obtain three-dimensional crystallographic information of novel zeolite nano-crystal of the tabular morphology by applying the new sample preparation technique.
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KEYWORD
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Electron crystallography, Tabular structure, Sample preparation, Grid dispersion, Focused ion beam
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